Next-Generation Business Intelligence Software with Silverlight 3: Bart Czernicki
Next-Generation Business Intelligence Software with Silverlight 3:1st ed Bart Czernicki
This edited book will serve as a source of reference for technologies and applications for multimodality data analytics in big data environments. After an introduction, the editors organize the book into four main parts on sentiment, affect and emotion analytics for big multimodal data; unsupervised learning strategies for big multimodal data; supervised learning strategies for big multimodal data; and multimodal big data processing and applications. The book will be of value to researchers, professionals and students in engineering and computer science, particularly those engaged with image and speech processing, multimodal information processing, data science, and artificial intelligence.
Applications of Computational Intelligence in Biology:Current Trends and Open Problems. Softcover of Or
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Informative, entertaining and upbeat, this book continues Grazier and Cass´s exploration of how technology, science, and scientists are portrayed in Hollywood productions. Both big and small-screen productions are featured and their science content illuminated-first by the authors and subsequently by a range of experts from science and the film world. Starring roles in this volume are played by, among other things, computers (human and mechanical), artificial intelligences, robots, and spacecraft. Interviews with writers, producers, and directors of acclaimed science-themed films stand side by side with the perspectives of scientists, science fiction authors, and science advisors. The result is a stimulating and informative reading experience for the layperson and professional scientist or engineer alike. The book begins with a foreword by Zack Stentz, who co-wrote X-Men: First Class and Thor , and is currently a writer/producer on CW´s The Flash.
The first part of this book addresses the need to use testing methods and discontinue FPM that is still the major ´´tool´´ of reliability development in the electronics industry. FPM is being used by many companies, especially military equipment contractors, as a key guide to developing a reliable product, although there is no supporting evidence of benefit. These probabilistic prediction methods do not produce or help to produce a reliable electronics system from the fact that most failures before technological obsolescence are due to one or more assignable causes, and not intrinsic wear out mechanisms. The first part of the book details the history of existing failure prediction methodologies, also the limitations of these existing methodologies using real field reliability data.The author presents a new approach, using early discovery testing. The methodologies described are derived from HALT (Highly Accelerated Stress Test) and HASS (Highly Accelerated Stress Screening), terms coined by the late Dr Gregg Hobbs. The new school of reliability development is a major paradigm shift because the process shifts the process from attempting to quantify reliability in the time domain (lifetime) whereas HALT references the strength of materials and empirical operational limits. The later chapters provide case study evidence, support and some guidance for electronics reliability engineers on using empirical step stress methods such as HALT to develop reliable, robust assemblies. Applications of this new methodology are described fully. Next Generation HALT and HASS presents a major paradigm shift from reliability prediction-based methods to discovery of electronic systems reliability risks. This is achieved by integrating highly accelerated life test (HALT) and highly accelerated stress screen (HASS) into a physics-of-failure-based robust product and process development methodology. The new methodologies challenge misleading and sometimes costly mis-application of probabilistic failure prediction methods (FPM) and provide a new deterministic map for reliability development. The authors clearly explain the new approach with a logical progression of problem statement and solutions. The book helps engineers employ HALT and HASS by illustrating why the misleading assumptions used for FPM are invalid. Next, the application of HALT and HASS empirical discovery methods to quickly find unreliable elements in electronics systems gives readers practical insight to the techniques. The physics of HALT and HASS methodologies are highlighted, illustrating how they uncover and isolate software failures due to hardware-software interactions in digital systems. The use of empirical operational stress limits for the development of future tools and reliability discriminators is described. Key features: * Provides a clear basis for moving from statistical reliability prediction models to practical methods of insuring and improving reliability. * Challenges existing failure prediction methodologies by highlighting their limitations using real field data. * Explains a practical approach to why and how HALT and HASS are applied to electronics and electromechanical systems. * Presents opportunities to develop reliability test discriminators for prognostics using empirical stress limits. * Guides engineers and managers on the benefits of the deterministic and more efficient methods of HALT and HASS. * Integrates the empirical limit discovery methods of HALT and HASS into a physics of failure based robust product and process development process.
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